USPTO serial 87462191
FIL-TECH
Reviewed by CopyMark Law Group
- Filing date
- Status date
- Registration date
- Jan 9, 2018
- Examiner
- MUNN LEWIS, LAKEISHA S
- Law office
- TMEG LAW OFFICE 105
What this means
Status 702 means the registration is active, Section 8 was accepted, and a Section 15 declaration of incontestability was also accepted. Incontestability strengthens your rights by limiting certain challenges after five years of continuous use. Continue use in commerce and plan for the 10-year Section 8 and 9 renewal.
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Owner
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Shehla Syed
Shehla Syed WEST HILL TECHNOLOGY COUNSEL900 CUMMINGS CENTER, SUITE 206-TBEVERLY, MA 01915UNITED STATESGoods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 001 | Silicon dioxide; fluids for vacuum applications to produce high and ultra-high vacuum and evaporation, namely, chemicals for industrial purposes | ACTIVE | Dec 20, 2016 |
| 002 | Greases for vacuum applications for use as an anti-rust protector; fluids for vacuum applications for anti-rust protection | ACTIVE | Dec 20, 2016 |
| 004 | Greases for vacuum applications for use as a lubricant, sealant, and anti-wear inhibitor; fluids for vacuum applications for lubrication and anti-wear inhibition | ACTIVE | Dec 20, 2016 |
| 006 | Chrome plated metal rods used for thin film evaporation | ACTIVE | Dec 20, 2016 |
| 007 | Filters for vacuum applications, namely, vacuum pump filters for oil filtration purposes | ACTIVE | Dec 20, 2016 |
| 009 | Scientific equipment and components for vacuum systems for measuring thin film and films, namely, rate and thickness monitors, rate and thickness controllers, oscillators, electrical cables, piezoelectric sensors for measuring pressure and vibration and thickness of thin films, quartz crystal piezoelectric sensors for measuring pressure and vibration and thickness of thin films, metal alloy piezoelectric sensors for measuring pressure and vibration and thickness of thin films, vacuum sensor heads in the nature of thickness measuring instruments, feed throughs in the nature of thickness measuring instruments for thin film deposition and measuring, electron beam gun parts used in electron beam gun evaporation equipment in the nature material evaporation equipment for measuring thickness of or depositing of thin films, electron beam gun crucibles in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, evaporation boats used in electron beam gun evaporation equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, shims used in electron beam gun evaporation equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, crucible liners used in electron beam gun equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, crucible covers being used in electron beam gun equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, helium leak detectors for leak detection in vacuum systems. leak detector filaments being structural parts of leak detectors for vacuum systems, ultra-high vacuum chamber structural parts, pressure gauges, hot cathode filaments used for the production of electrons in the nature of cathodes for measurement of thickness during deposition of thin films, emitters in the nature of electron beam gun equipment for measuring thickness of or depositing of thin films, electromagnetic coils, gas distributors in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, cathode tips in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, keepers in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, anodes, ion source parts in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, thermocouples, thermocouple controllers for pressure measurement, convection vacuum pressure measurement gauges, ionization gauge tubes in the nature of nude or glass hot cathode pressure gauges, replacement filaments in the nature of nude hot cathode pressure gauges, calibrated gauges for detecting helium leaks, and replacement filaments used in leak detectors and leak testing systems in the nature of cathodes for measurement of thickness during deposition of thin films; Sensors for measuring film, namely, piezoelectric sensors for measuring pressure and vibration | ACTIVE | Dec 20, 2016 |
| 017 | Electric and thermal insulators | ACTIVE | Dec 20, 2016 |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by Fil-Tech, Inc.
- Other trademarks owned by Fil-Tech, Inc.
- Other trademarks owned by Fil-Tech, Inc.
- Other trademarks in Class 001
- Other trademarks in Class 002
- Other trademarks in Class 004
- Other trademarks in Class 006
- Other trademarks in Class 007
- Other trademarks in Class 009
- Other trademarks in Class 017
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Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Aug 14, 2023 | NA85 | NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED | — |
| Aug 14, 2023 | C15A | REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. | — |
| Aug 14, 2023 | APRE | CASE ASSIGNED TO POST REGISTRATION PARALEGAL | — |
| Feb 14, 2023 | E815 | TEAS SECTION 8 & 15 RECEIVED | — |
| Jan 9, 2023 | REM1 | COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED | — |
| Jan 9, 2018 | R.PR | REGISTERED-PRINCIPAL REGISTER | Your trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive. |
| Oct 24, 2017 | NPUB | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | — |
| Oct 24, 2017 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Oct 4, 2017 | NONP | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | — |
| Sep 8, 2017 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Aug 31, 2017 | XAEC | EXAMINER'S AMENDMENT ENTERED | — |
| Aug 31, 2017 | GNEN | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | — |
| Aug 31, 2017 | GNEA | EXAMINERS AMENDMENT E-MAILED | — |
| Aug 31, 2017 | CNEA | EXAMINERS AMENDMENT -WRITTEN | — |
| Aug 23, 2017 | DOCK | ASSIGNED TO EXAMINER | — |
| Jun 1, 2017 | MDSC | NOTICE OF DESIGN SEARCH CODE E-MAILED | — |
| May 31, 2017 | NWOS | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | — |
| May 27, 2017 | NWAP | NEW APPLICATION ENTERED | — |