USPTO serial 76182067
NLINE
Reviewed by CopyMark Law Group
- Filing date
- Status date
- Registration date
- Feb 8, 2005
- Examiner
- MICHOS, JOHN E
- Law office
- PUBLICATION AND ISSUE SECTION
What this means
Status 710 means the registration was cancelled because a required Section 8 declaration of continued use was not filed within the deadline (including any grace period). The federal registration is no longer active. Evaluate filing a new application if you still use the mark, or petition if cancellation was erroneous. Consult counsel on remaining common-law rights.
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Owner
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
THOMAS R FELGER
THOMAS R FELGER BAKER BOTTS LLP2001 ROSS AVEDALLAS, TX 75201-2980UNITED STATESGoods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 009 | Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors | SECTION 8 - CANCELLED | Jul 1, 2000 |
| 037 | Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 1, 2000 |
| 040 | Custom manufacture and design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 1, 2000 |
| 042 | On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 1, 2000 |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by nLine Corporation
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Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Sep 9, 2011 | C8.. | CANCELLED SEC. 8 (6-YR) | — |
| Feb 8, 2005 | R.PR | REGISTERED-PRINCIPAL REGISTER | Your trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive. |
| Dec 10, 2004 | REGV | LAW OFFICE REGISTRATION REVIEW COMPLETED | — |
| Dec 6, 2004 | ALIE | ASSIGNED TO LIE | — |
| Nov 28, 2004 | CNPR | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED | — |
| Nov 8, 2004 | SUPC | STATEMENT OF USE PROCESSING COMPLETE | — |
| Oct 15, 2004 | IUAF | USE AMENDMENT FILED | — |
| Oct 15, 2004 | PAPER RECEIVED | — | |
| Aug 31, 2004 | CFIT | CASE FILE IN TICRS | — |
| May 11, 2004 | FAXX | FAX RECEIVED | — |
| May 4, 2004 | NOAM | NOA MAILED - SOU REQUIRED FROM APPLICANT | A Notice of Allowance means your intent-to-use application cleared examination and opposition but is not registered yet. You must file a Statement of Use showing the mark in commerce, or request an extension, before the deadline — usually six months from the notice date. |
| Oct 22, 2002 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Oct 2, 2002 | NPUB | NOTICE OF PUBLICATION | — |
| Jul 18, 2002 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Jul 5, 2002 | DOCK | ASSIGNED TO EXAMINER | — |
| Mar 25, 2002 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Mar 25, 2002 | PAPER RECEIVED | — | |
| Mar 5, 2002 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Sep 24, 2001 | CNFR | FINAL REFUSAL MAILED | A final Office Action (final refusal) means the examining attorney is maintaining at least one refusal and your options are narrower. You can file a response addressing the refusal, appeal to the Trademark Trial and Appeal Board, or let the application abandon. |
| Jun 11, 2001 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Mar 22, 2001 | CNRT | NON-FINAL ACTION MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Mar 20, 2001 | DOCK | ASSIGNED TO EXAMINER | — |