USPTO serial 76198020
Reviewed by CopyMark Law Group
This page summarizes the public USPTO record for this serial number, including owners, goods and services, and prosecution history.
If you own this trademark, we can monitor new filings and help with USPTO deadlines. If you do not, we can file a new U.S. application.
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Curtis B Hamre
CURTIS B HAMRE MERCHANT & GOULD PCP O BOX 2910MINNEAPOLIS, MN 55402-0910UNITED STATES| Class | Description | Status | First use |
|---|---|---|---|
| 009 | Precision measuring machines, namely wafer thickness measuring machine, non-contact flatness measuring machine, digital length measuring machine, laser interference length measuring sensor, optical fiber laser interferometer measuring machine, surface texture measuring machine, three-dimensional measuring machine, surface texture and contour measuring machine, contour measuring machine, roundness measuring machine, roundness and cylindrical/flat profile analysis machine, coordinate measuring machine; data processing machines for use in processing coordinate measuring data, machine control gauge, displacement sensor, electric micrometer, pneumatic micrometer; computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines and instruments and their parts and fittings, namely ultrasonic depth sounders; Automatic distribution vending machines; Network system comprised of computer hardware and software for wafer probing machines; Wafer inspection units | ACTIVE | — |
| 037 | Repair and maintenance service for manufacturing and measuring apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; repair and maintenance of data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines | ACTIVE | — |
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
| Date | Code | Event | What it means |
|---|---|---|---|
| Nov 21, 2005 | MAB6 | ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED | The intent-to-use application was abandoned because no acceptable Statement of Use (or valid extension) was filed before the Notice of Allowance deadline expired. The application is dead unless revived within a limited window. |
| Nov 21, 2005 | ABN6 | ABANDONMENT - NO USE STATEMENT FILED | The intent-to-use application was abandoned because no acceptable Statement of Use (or valid extension) was filed before the Notice of Allowance deadline expired. The application is dead unless revived within a limited window. |
| Apr 9, 2005 | EX3G | SOU EXTENSION 3 GRANTED | — |
| Mar 16, 2005 | EXT3 | SOU EXTENSION 3 FILED | — |
| Mar 16, 2005 | EEXT | SOU TEAS EXTENSION RECEIVED | The applicant requested more time to file a Statement of Use before the Notice of Allowance deadline. Each extension typically adds six months. A limited number of extensions are available for intent-to-use applications not yet in use. |
| Sep 20, 2004 | EX2G | SOU EXTENSION 2 GRANTED | — |
| Sep 9, 2004 | EXT2 | SOU EXTENSION 2 FILED | — |
| Sep 9, 2004 | EEXT | SOU TEAS EXTENSION RECEIVED | The applicant requested more time to file a Statement of Use before the Notice of Allowance deadline. Each extension typically adds six months. A limited number of extensions are available for intent-to-use applications not yet in use. |
| Aug 17, 2004 | CFIT | CASE FILE IN TICRS | — |
| Apr 26, 2004 | DOCK | ASSIGNED TO EXAMINER | — |
| Mar 25, 2004 | EX1G | SOU EXTENSION 1 GRANTED | — |
| Mar 15, 2004 | PAPER RECEIVED | — | |
| Mar 12, 2004 | EXT1 | SOU EXTENSION 1 FILED | — |
| Sep 16, 2003 | NOAM | NOA MAILED - SOU REQUIRED FROM APPLICANT | A Notice of Allowance means your intent-to-use application cleared examination and opposition but is not registered yet. You must file a Statement of Use showing the mark in commerce, or request an extension, before the deadline — usually six months from the notice date. |
| Jun 24, 2003 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Jun 4, 2003 | NPUB | NOTICE OF PUBLICATION | — |
| Apr 12, 2003 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Apr 1, 2003 | FAXX | FAX RECEIVED | — |
| Mar 13, 2003 | CNRT | NON-FINAL ACTION MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Mar 12, 2003 | ZZZX | PREVIOUS ALLOWANCE COUNT WITHDRAWN | — |
| Mar 3, 2003 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Jan 13, 2003 | PAPER RECEIVED | — | |
| Jan 8, 2003 | DOCK | ASSIGNED TO EXAMINER | — |
| Jan 8, 2003 | ZZZX | PREVIOUS ALLOWANCE COUNT WITHDRAWN | — |
| Sep 12, 2002 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Jul 15, 2002 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Jul 15, 2002 | PAPER RECEIVED | — | |
| Feb 11, 2002 | CNFR | FINAL REFUSAL MAILED | A final Office Action (final refusal) means the examining attorney is maintaining at least one refusal and your options are narrower. You can file a response addressing the refusal, appeal to the Trademark Trial and Appeal Board, or let the application abandon. |
| Nov 9, 2001 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| May 11, 2001 | CNRT | NON-FINAL ACTION MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| May 8, 2001 | DOCK | ASSIGNED TO EXAMINER | — |
| Apr 30, 2001 | DOCK | ASSIGNED TO EXAMINER | — |