USPTO serial 76347903
FATHOM
Reviewed by CopyMark Law Group
Reg. 2807148Status 710
- Filing date
- Status date
- Registration date
- Jan 20, 2004
- Examiner
- RAUEN, JAMES
- Law office
- FILE REPOSITORY (FRANCONIA)
What this means
Status 710 means the registration was cancelled because a required Section 8 declaration of continued use was not filed within the deadline (including any grace period). The federal registration is no longer active. Evaluate filing a new application if you still use the mark, or petition if cancellation was erroneous. Consult counsel on remaining common-law rights.
Need help with FATHOM?
If you own this trademark, we can monitor new filings and help with USPTO deadlines. If you do not, we can file a new U.S. application.
Current trademark owner
Monitor this mark, or talk with CopyMark about this registration.
Not the owner?
File a new U.S. trademark application, or speak with our attorneys.
Owner
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Pamela S. Ratliff
PAMELA S RATLIFF BAKER BOTTS LLP2001 ROSS AVE STE 600DALLAS, TX 75201-2980UNITED STATESGoods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 009 | Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors | SECTION 8 - CANCELLED | Jul 3, 2002 |
| 037 | Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 3, 2002 |
| 040 | Custom manufacture of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 3, 2002 |
| 042 | On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes; design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes | SECTION 8 - CANCELLED | Jul 3, 2002 |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by NLINE CORPORATION
- Other trademarks owned by NLINE CORPORATION
- Other trademarks owned by NLINE CORPORATION
- Other trademarks in Class 009
- Other trademarks in Class 037
- Other trademarks in Class 040
- Other trademarks in Class 042
- Similar marks named FATHOM
- Recently changed USPTO trademarks
- Recently filed trademarks
- Browse all trademark records
Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Aug 27, 2010 | C8.. | CANCELLED SEC. 8 (6-YR) | — |
| Jan 20, 2004 | R.PR | REGISTERED-PRINCIPAL REGISTER | Your trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive. |
| Nov 26, 2003 | CNPR | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED | — |
| Nov 24, 2003 | DOCK | ASSIGNED TO EXAMINER | — |
| Nov 21, 2003 | CFIT | CASE FILE IN TICRS | — |
| Nov 10, 2003 | SUPC | STATEMENT OF USE PROCESSING COMPLETE | — |
| Nov 6, 2003 | EX1G | SOU EXTENSION 1 GRANTED | — |
| Oct 6, 2003 | IUAF | USE AMENDMENT FILED | — |
| Oct 6, 2003 | EXT1 | SOU EXTENSION 1 FILED | — |
| Oct 6, 2003 | PAPER RECEIVED | — | |
| Apr 8, 2003 | NOAM | NOA MAILED - SOU REQUIRED FROM APPLICANT | A Notice of Allowance means your intent-to-use application cleared examination and opposition but is not registered yet. You must file a Statement of Use showing the mark in commerce, or request an extension, before the deadline — usually six months from the notice date. |
| Jan 14, 2003 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Dec 25, 2002 | NPUB | NOTICE OF PUBLICATION | — |
| Nov 14, 2002 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Nov 6, 2002 | CNEA | EXAMINERS AMENDMENT MAILED | — |
| Sep 24, 2002 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Sep 24, 2002 | PAPER RECEIVED | — | |
| Mar 27, 2002 | CNRT | NON-FINAL ACTION MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Mar 13, 2002 | DOCK | ASSIGNED TO EXAMINER | — |