USPTO serial 78641626
FEI COMPANY TOOLS FOR NANOTECH
Reviewed by CopyMark Law Group
Reg. 3431150Status 710
- Filing date
- Status date
- Registration date
- May 20, 2008
- Examiner
- EISINGER, REBECCA MILES
- Law office
- PUBLICATION AND ISSUE SECTION
What this means
Status 710 means the registration was cancelled because a required Section 8 declaration of continued use was not filed within the deadline (including any grace period). The federal registration is no longer active. Evaluate filing a new application if you still use the mark, or petition if cancellation was erroneous. Consult counsel on remaining common-law rights.
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Owner
Hillsboro, OR
Hillsboro, OR
Hillsboro, OR
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Jere M. Webb
JERE M. WEBB STOEL RIVES LLP900 SW 5TH AVENUESUITE 2600PTLAND, OR 97204-1268Goods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 007 | Components of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes | SECTION 8 - CANCELLED | — |
| 009 | Focused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery | SECTION 8 - CANCELLED | — |
| 037 | Repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes | SECTION 8 - CANCELLED | — |
| 041 | Training in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes | SECTION 8 - CANCELLED | — |
| 042 | Scientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software | SECTION 8 - CANCELLED | — |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by FEI Company
- Other trademarks owned by FEI Company
- Other trademarks owned by FEI Company
- Other trademarks in Class 007
- Other trademarks in Class 009
- Other trademarks in Class 037
- Other trademarks in Class 041
- Other trademarks in Class 042
- Similar marks named FEI COMPANY TOOLS FOR NANOTECH
- Recently changed USPTO trademarks
- Recently filed trademarks
- Browse all trademark records
Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Dec 26, 2014 | C8.. | CANCELLED SEC. 8 (6-YR) | — |
| May 20, 2008 | R.PR | REGISTERED-PRINCIPAL REGISTER | Your trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive. |
| Mar 4, 2008 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Feb 13, 2008 | NPUB | NOTICE OF PUBLICATION | — |
| Jan 31, 2008 | PREV | LAW OFFICE PUBLICATION REVIEW COMPLETED | — |
| Jan 11, 2008 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Jan 11, 2008 | XAEC | EXAMINER'S AMENDMENT ENTERED | — |
| Jan 11, 2008 | GNEN | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | — |
| Jan 11, 2008 | GNEA | EXAMINERS AMENDMENT E-MAILED | — |
| Jan 11, 2008 | CNEA | EXAMINERS AMENDMENT -WRITTEN | — |
| Jan 10, 2008 | DOCK | ASSIGNED TO EXAMINER | — |
| Jan 10, 2008 | ZZZX | PREVIOUS ALLOWANCE COUNT WITHDRAWN | — |
| Jan 10, 2008 | DOCK | ASSIGNED TO EXAMINER | — |
| Jan 7, 2008 | DOCK | ASSIGNED TO EXAMINER | — |
| Aug 6, 2007 | PBCR | WITHDRAWN FROM PUB - OG REVIEW QUERY | — |
| May 23, 2007 | PREV | LAW OFFICE PUBLICATION REVIEW COMPLETED | — |
| May 20, 2007 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| May 20, 2007 | XAEC | EXAMINER'S AMENDMENT ENTERED | — |
| May 20, 2007 | GNEA | EXAMINERS AMENDMENT E-MAILED | — |
| May 20, 2007 | CNEA | EXAMINERS AMENDMENT -WRITTEN | — |
| May 16, 2007 | ZZZX | PREVIOUS ALLOWANCE COUNT WITHDRAWN | — |
| Mar 26, 2007 | PBCR | WITHDRAWN FROM PUB - OG REVIEW QUERY | — |
| Mar 1, 2007 | PREV | LAW OFFICE PUBLICATION REVIEW COMPLETED | — |
| Feb 17, 2007 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Feb 16, 2007 | XAEC | EXAMINER'S AMENDMENT ENTERED | — |
| Feb 16, 2007 | ALIE | ASSIGNED TO LIE | — |
| Feb 15, 2007 | GNEA | EXAMINERS AMENDMENT E-MAILED | — |
| Feb 15, 2007 | CNEA | EXAMINERS AMENDMENT -WRITTEN | — |
| Aug 15, 2006 | GNFR | FINAL REFUSAL E-MAILED | A final Office Action (final refusal) means the examining attorney is maintaining at least one refusal and your options are narrower. You can file a response addressing the refusal, appeal to the Trademark Trial and Appeal Board, or let the application abandon. |
| Aug 15, 2006 | CNFR | FINAL REFUSAL WRITTEN | A final Office Action (final refusal) means the examining attorney is maintaining at least one refusal and your options are narrower. You can file a response addressing the refusal, appeal to the Trademark Trial and Appeal Board, or let the application abandon. |
| Jul 27, 2006 | ACEC | AMENDMENT FROM APPLICANT ENTERED | — |
| Jul 3, 2006 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Jul 3, 2006 | PAPER RECEIVED | — | |
| Jan 5, 2006 | GNRT | NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Jan 5, 2006 | CNRT | NON-FINAL ACTION WRITTEN | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Dec 21, 2005 | DOCK | ASSIGNED TO EXAMINER | — |
| Jun 8, 2005 | NWAP | NEW APPLICATION ENTERED | — |