USPTO serial 79379510
INSPEC
Reviewed by CopyMark Law Group
- Filing date
- Status date
- Registration date
- —
- Examiner
- ABID, NABEELA
- Law office
- TMO LAW OFFICE 132
What this means
These status codes mean the trademark application is abandoned and no longer pending. Common reasons include missing an Office Action response (600), filing without a valid basis (602), express abandonment by the applicant (604), or failure to respond to an examiner's inquiry (618). Revival may be possible in limited circumstances. If abandonment was unintentional, consult counsel about a petition to revive. Otherwise file a new application if protection is still needed.
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Owner
Goods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 009 | Downloadable computer software for remote monitoring and analysis for use in patterning, processing in the fields of micro and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software for monitoring, analysing, controlling and running physical world operations all in the fields of micro- and nanoscale science and technology; computer software for use in remote meter monitoring; measuring, detecting, monitoring and controlling devices; scanning electron microscopes; scanning probe microscopes; apparatus and instruments for scanning probe microscopy; metering software, recognition software, monitoring software, control software, the aforementioned goods for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: metrology; software, for use in the following fields: control of micro structuring and nano structuring systems; software, for use in the following fields: control of lithography systems; software, for use in the following fields: classification in the fields of micro- and nanoscale science and technology; software, for use in the following fields: detection of defects; software, for use in the following fields: process control in the fields of micro- and nanoscale science and technology; software, for use in the following fields: process monitoring in the fields of micro- and nanoscale science and technology; microscopy software; software, for use in relation to the following goods: scanning electron microscopes; software, for use in the following fields: surface structuring; software, for use in the following fields: surface analysis; software, for use in the following fields: material analyzes; automation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; simulation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: monte carlo simulations; simulation software, for use in the following fields: material analyzes; simulation software, for use in the following fields: surface analysis; simulation software, for use in the following fields: scanning electron microscopes; calibration software; measuring sensors; computer hardware for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection | ACTIVE | — |
| 042 | Materials testing and analysing; calibration services relating to analytical apparatus; installation, maintenance, updating and upgrading of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; installation, maintenance and updating of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software as a service [SaaS] for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design, development and programming of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design and development of computer software for process control in the fields of micro- and nanoscale science and technology; software design for others for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; calibration of processes | ACTIVE | — |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Nov 15, 2025 | FINT | FINAL DECISION TRANSACTION PROCESSED BY IB | — |
| Oct 28, 2025 | FICS | FINAL DISPOSITION NOTICE SENT TO IB | — |
| Oct 28, 2025 | FICR | FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB | — |
| Mar 14, 2025 | OPNX | NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB | — |
| Feb 27, 2025 | OPNS | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | — |
| Feb 27, 2025 | OPNR | NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB | — |
| Oct 28, 2024 | MAB2 | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | The trademark application was abandoned because a required response or document was not filed by the deadline — usually a missed Office Action response. The application is dead unless a petition to revive is granted within a limited time. |
| Oct 28, 2024 | ABN2 | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | The trademark application was abandoned because a required response or document was not filed by the deadline — usually a missed Office Action response. The application is dead unless a petition to revive is granted within a limited time. |
| May 8, 2024 | RFNT | REFUSAL PROCESSED BY IB | — |
| Apr 15, 2024 | RFCS | NON-FINAL ACTION MAILED - REFUSAL SENT TO IB | — |
| Apr 15, 2024 | RFRR | REFUSAL PROCESSED BY MPU | — |
| Mar 28, 2024 | RFCR | NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW | — |
| Mar 27, 2024 | CNRT | NON-FINAL ACTION WRITTEN | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Mar 27, 2024 | LOPR | LETTER OF PROTEST EVIDENCE REVIEWED-NO FURTHER ACTION TAKEN | — |
| Mar 27, 2024 | DOCK | ASSIGNED TO EXAMINER | — |
| Dec 9, 2023 | LOPT | LETTER OF PROTEST EVIDENCE FORWARDED | — |
| Oct 3, 2023 | MAFR | APPLICATION FILING RECEIPT MAILED | — |
| Sep 29, 2023 | NWOS | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | — |
| Sep 28, 2023 | REPR | SN ASSIGNED FOR SECT 66A APPL FROM IB | — |