CopyMark Law Group
4.9/5
Drawing for SEMILAB

USPTO serial 88632625

SEMILAB

Reviewed by CopyMark Law Group

Reg. 6042056Status 702Registered
Filing date
Status date
Registration date
Apr 28, 2020
Examiner
DINALLO, KEVIN M
Law office
Historical data usage

What this means

Status 702 means the registration is active, Section 8 was accepted, and a Section 15 declaration of incontestability was also accepted. Incontestability strengthens your rights by limiting certain challenges after five years of continuous use. Continue use in commerce and plan for the 10-year Section 8 and 9 renewal.

Status 702: Status 702 means the registration is active, Section 8 was accepted, and a Section 15 declaration of incontestability was also accepted. Incontestability strengthens your rights by limiting certain challenges after five years of continuous use.

Need help with SEMILAB?

If you own this trademark, we can monitor new filings and help with USPTO deadlines. If you do not, we can file a new U.S. application.

Current trademark owner
Monitor this mark, or talk with CopyMark about this registration.
Trademark Monitoring
(312) 319-4460
Not the owner?
File a new U.S. trademark application, or speak with our attorneys.
Start a new application
(312) 319-4460

Owner

Attorney of record

The USPTO lists this attorney as the applicant's representative for correspondence on this application.

Stephen E. Kelly

Patrick A. Reid HILL WARD HENDERSON, P.A.101 E. KENNEDY BOULEVARD, SUITE 3700TAMPA, FL 33602United States

Goods and services

ClassDescriptionStatusFirst use
009Scientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and interfaces, characterization of 3D structures, metallization control, and dielectric porosity measurement; Photovoltaic instruments for controlling the crystalline silicon solar cell manufacturing process, namely, instruments for silicon ingot and block testing, silicon wafer sorting, inline process control, offline process control, laboratory applications, and thin film applications; Scientific instruments for monitoring the production of flat panel displays, namely, instruments for monitoring the manufacturing of full-tone and half tone (photoresist), printed OLED sub-pixel characterization, IGZO electrical characterization, sheet resistance measurement, thin film characterization, ELA process characterization (LTPS), and bare glassACTIVEJun 11, 2009
042Research and development in the field of semiconductor metrology, photovoltaic metrology, and flat panel display metrology; Custom design of metrology equipment to the specification of othersACTIVEJun 11, 2009

Related trademarks

CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.

Prosecution history

DateCodeEventWhat it means
Sep 23, 2026NA85NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED—
Sep 23, 2026C15AREGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.—
Sep 18, 2026APRECASE ASSIGNED TO POST REGISTRATION PARALEGAL—
Sep 18, 2026E815TEAS SECTION 8 & 15 RECEIVED—
Apr 28, 2025REM1COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED—
Mar 11, 2025NURCNOTICE OF UPDATED REGISTRATION CONFIRMATION EMAILED—
Feb 20, 2025COC.CORRECTION UNDER SECTION 7 - PROCESSED—
Feb 19, 2025EROPTEAS RESPONSE TO OFFICE ACTION-POST REG RECEIVED—
Jan 21, 2025PRAMPOST REGISTRATION ACTION MAILED - SEC. 7—
Dec 9, 2024APRECASE ASSIGNED TO POST REGISTRATION PARALEGAL—
Jun 5, 2024ES7RTEAS SECTION 7 REQUEST RECEIVED—
Apr 28, 2020R.PRREGISTERED-PRINCIPAL REGISTERYour trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive.
Feb 11, 2020NPUBOFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED—
Feb 11, 2020PUBOPUBLISHED FOR OPPOSITIONYour mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance.
Jan 22, 2020NONPNOTIFICATION OF NOTICE OF PUBLICATION E-MAILED—
Jan 3, 2020CNSAAPPROVED FOR PUB - PRINCIPAL REGISTER—
Dec 30, 2019DOCKASSIGNED TO EXAMINER—
Oct 2, 2019NWOSNEW APPLICATION OFFICE SUPPLIED DATA ENTERED—
Sep 30, 2019NWAPNEW APPLICATION ENTERED—

Frequently asked questions

Related guidance