USPTO serial 97308047
NANOMETRICS
Reviewed by CopyMark Law Group
- Filing date
- Status date
- Registration date
- Jul 9, 2024
- Examiner
- ALTREE, NICHOLAS
- Law office
- PUBLICATION AND ISSUE SECTION
What this means
Status 700 means the trademark is registered and active on the Principal Register. You have nationwide rights for the listed goods and services and may use ®. Section 8 maintenance is due between years five and six. Calendar Section 8 between years five and six, and consider trademark monitoring.
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Owner
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Heather J. Kliebenstein
Heather J. Kliebenstein MERCHANT & GOULD P.C.P.O. BOX 2910MINNEAPOLIS, MN 55402-0910United StatesGoods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 007 | Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components | ACTIVE | Sep 1, 2023 |
| 009 | Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers | ACTIVE | Dec 14, 1976 |
| 042 | Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies; providing online non-downloadable software for the semiconductor industry, namely, online non-downloadable software for identifying defects in semiconductor structures, online non-downloadable software for identifying semiconductor fabrication process excursions, online non-downloadable software for recording and reviewing defects in semiconductors structures, online non-downloadable software for identifying root causes of defects in semiconductor structures, and online non-downloadable software for controlling and monitoring semiconductor fabrication equipment | ACTIVE | Mar 29, 2024 |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by Onto Innovation Inc.
- Other trademarks owned by Onto Innovation Inc.
- Other trademarks owned by Onto Innovation Inc.
- Other trademarks in Class 007
- Other trademarks in Class 009
- Other trademarks in Class 042
- Similar marks named NANOMETRICS
- Recently changed USPTO trademarks
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Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Jul 9, 2024 | NRCC | NOTICE OF REGISTRATION CONFIRMATION EMAILED | — |
| Jul 9, 2024 | R.PR | REGISTERED-PRINCIPAL REGISTER | Your trademark is registered on the Principal Register — the strongest form of federal trademark protection. You may use the ® symbol for the covered goods and services. Maintenance filings (Section 8 and renewals) are required to keep the registration alive. |
| May 31, 2024 | SUNA | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED | — |
| May 31, 2024 | CNPR | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED | — |
| May 29, 2024 | SUPC | STATEMENT OF USE PROCESSING COMPLETE | — |
| May 28, 2024 | AITU | CASE ASSIGNED TO INTENT TO USE PARALEGAL | — |
| Apr 30, 2024 | IUAF | USE AMENDMENT FILED | — |
| Apr 30, 2024 | EISU | TEAS STATEMENT OF USE RECEIVED | The applicant filed a Statement of Use with specimens showing the mark in actual commerce. The USPTO will review the filing for compliance. If accepted, the mark can proceed to registration; if deficient, the USPTO may issue a requirement or office action. |
| Dec 2, 2023 | EXRA | NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED | — |
| Nov 30, 2023 | EX1G | SOU EXTENSION 1 GRANTED | — |
| Nov 30, 2023 | EXT1 | SOU EXTENSION 1 FILED | — |
| Nov 30, 2023 | EEXT | SOU TEAS EXTENSION RECEIVED | The applicant requested more time to file a Statement of Use before the Notice of Allowance deadline. Each extension typically adds six months. A limited number of extensions are available for intent-to-use applications not yet in use. |
| May 30, 2023 | NOAM | NOA E-MAILED - SOU REQUIRED FROM APPLICANT | A Notice of Allowance means your intent-to-use application cleared examination and opposition but is not registered yet. You must file a Statement of Use showing the mark in commerce, or request an extension, before the deadline — usually six months from the notice date. |
| Apr 4, 2023 | NPUB | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | — |
| Apr 4, 2023 | PUBO | PUBLISHED FOR OPPOSITION | Your mark was published in the USPTO Official Gazette for a 30-day opposition window. During that period, third parties who believe they would be harmed can file an opposition. If no opposition is filed, prosecution usually continues toward registration or a Notice of Allowance. |
| Mar 15, 2023 | NONP | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | — |
| Mar 1, 2023 | CNSA | APPROVED FOR PUB - PRINCIPAL REGISTER | — |
| Mar 1, 2023 | TEME | TEAS/EMAIL CORRESPONDENCE ENTERED | — |
| Feb 28, 2023 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Feb 28, 2023 | TROA | TEAS RESPONSE TO OFFICE ACTION RECEIVED | This event means the applicant filed a response to a USPTO Office Action — typically arguments, amendments, or evidence addressing the examiner's objections. The USPTO will review the response and either allow the mark to proceed or issue another action. |
| Aug 30, 2022 | GNRN | NOTIFICATION OF NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Aug 30, 2022 | GNRT | NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Aug 30, 2022 | CNRT | NON-FINAL ACTION WRITTEN | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| May 2, 2022 | DOCK | ASSIGNED TO EXAMINER | — |
| Mar 16, 2022 | NWOS | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | — |
| Mar 15, 2022 | NWAP | NEW APPLICATION ENTERED | — |