USPTO serial 97308052
ONTO
Reviewed by CopyMark Law Group
Status 601
- Filing date
- Status date
- Registration date
- —
- Examiner
- —
- Law office
- NEW APPLICATION PROCESSING
What this means
This page summarizes the public USPTO record for this serial number, including owners, goods and services, and prosecution history.
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Owner
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Heather J. Kliebenstein
HEATHER J. KLIEBENSTEIN MERCHANT & GOULD P.C.P.O. BOX 2910MINNEAPOLIS, MN 55402-0910UNITED STATESGoods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 009 | Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials; Metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; Metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; Metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; Optical inspection equipment for 2D and 3D inspection of semiconductor materials; Metrology instruments metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology | ACTIVE | — |
| 042 | Software for the semiconductor industry, namely, software for identifying defects in semiconductor structures, software for identifying semiconductor fabrication process excursions, software for recording and reviewing defects in semiconductors structures, software for identifying root causes of defects in semiconductor structures, and software for controlling and monitoring semiconductor fabrication equipment | ACTIVE | — |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Mar 30, 2022 | MAB1 | ABANDONMENT NOTICE E-MAILED - EXPRESS ABANDONMENT | — |
| Mar 30, 2022 | ABN1 | ABANDONMENT - EXPRESS MAILED | — |
| Mar 29, 2022 | EXAR | TEAS EXPRESS ABANDONMENT RECEIVED | — |
| Mar 16, 2022 | NWOS | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | — |
| Mar 15, 2022 | NWAP | NEW APPLICATION ENTERED | — |