USPTO serial 99665676
PVA
Reviewed by CopyMark Law Group
Status 641Office Action
- Filing date
- Status date
- Registration date
- —
- Examiner
- SWAIN, MICHELE LYNN
- Law office
- TMO LAW OFFICE 116
What this means
The USPTO has issued an Office Action on this application. A response is typically required before the deadline, or the application can be abandoned.
Need help with PVA?
If you own this trademark, we can monitor new filings and help with USPTO deadlines. If you do not, we can file a new U.S. application.
Current trademark owner
Get help with this Office Action, set up monitoring, or talk with CopyMark.
Not the owner?
File a new U.S. trademark application, or speak with our attorneys.
Owner
Wettenberg, DE
Attorney of record
The USPTO lists this attorney as the applicant's representative for correspondence on this application.
Richard W. Hoffmann
Richard W. Hoffmann Reising Ethington P.C.755 W. Big Beaver Rd.Suite 1850TROY, MI 48084Goods and services
| Class | Description | Status | First use |
|---|---|---|---|
| 006 | Alloys of common metal | ACTIVE | — |
| 007 | Machines and machine tools for treatment of materials and for manufacturing; machines and machine tools for material processing and production, as well as their parts and accessories; mechanical plants for surface treatment with plasma; mechanical plants for plasma etching; Nitriding machines for surface hardening of materials; mechanical vacuum plants for pressure sintering, for melting, except melting furnaces, for casting, for soldering, and for diffusion welding, and their structrual parts; material testing machines | ACTIVE | — |
| 009 | Material testing instruments and machines; measuring devices and instruments for determining the properties of wafers and ingots; ultrasonic microscopes; downloadable software for material testing instruments and machines, except software in the field of project-, transaction,- and asset-portfolio-management; Optical measurement apparatus for non-destructive characterization of materials in the semiconductor and advanced materials industries; Optical apparatus and instruments for non-destructive characterization of wafers and ingots; Apparatus and instruments for microscopy; Laboratory instruments, other than for medical use, for non-destructive characterization of materials in the semiconductor and advanced materials industries; Testing apparatus and instruments for non-destructive characterization of materials in the semiconductor and advanced materials industries; Apparatus and instruments for physics for material testing; Scientific apparatus and instruments for material testing; Optical inspection apparatus for industrial use for material testing; Spectroscopes; downloadable software for machine learning, except for software in the field of project-, transaction-, and asset-portfolio-management; downloadable software for artificial intelligence, except for software in the field of project-, transaction-, and asset-portfolio-management; downloadable artificial intelligence software and machine learning software for material testing instruments and machines, except for software in the field of project-, transaction-, and asset-portfolio-management; Downloadable software for non-destructive characterization of materials in the semiconductor and advanced materials industries, except for software in the field of project-, transaction-, and asset-portfolio-management; downloadable web applications and server software for measurement strategies and evaluation procedures in the field of material testing, except for web applications and software in the field of project-, transaction-, and asset-portfolio-management; Material testing instruments and material testing devices for inspecting materials and components, namely, microscopes and ultrasonic devices; measuring instruments and measuring devices for inspecting materials and components, namely Scanning Acoustic Microscopes and ultrasonic devices; optical apparatus and instruments for inspecting materials and components, namely, Scanning Acoustic Microscopes and ultrasonic devices; Material testing instruments and material testing devices for inspecting materials and components using acoustic, wet chemical, and optical methods, namely Scanning Acoustic Microscopes and ultrasonic devices; measuring instruments and measuring devices for inspecting materials and components using acoustic, wet chemical, and optical methods, namely, Scanning Acoustic Microscopes and ultrasonic devices; optical apparatus and instruments for inspecting materials and components using acoustic, wet chemical, and optical methods, namely, Scanning Acoustic Microscopes and ultrasonic devices. | ACTIVE | — |
| 010 | Medical apparatus and instruments for implant procedures; Medical implants; dental implants; measuring instruments adapted for medical purposes for post-processing of implant materials | ACTIVE | — |
| 011 | Industrial treatment apparatus and installations; industrial treatment apparatus and installations, as well as their parts and accessories; Sterilizing installations; gas plasma sterilizing installations for metallic and ceramic components; Smelting furnaces; heat treatment installations (furnaces); Industrial ovens; vacuum furnaces, as well as parts and accessories for the aforementioned instalations, insofar as included in class 11; mechanical installations for growing crystals [crysrtallizers]; mechanical installations for growing crystals [crystallizers] for the production of semiconductors and solar cells | ACTIVE | — |
| 014 | Precious metals and their alloys | ACTIVE | — |
| 040 | Surface treatments of metallic and ceramic components; surface treatments of metallic and ceramic components with plasma; heat treatments of metallic and ceramic components; execution of vacuum brazing and diffusion welding; heat treatment of metallic and ceramic materials; plasma nitriding of metallic and ceramic components; sintering of metallic and ceramic materials; plasma fine cleaning of metallic and ceramic components; powder metallurgical production of high-temperature materials; production of implants and dental alloys | ACTIVE | — |
| 042 | Scientific technological services, namely, non-destructive characterization of materials in the semiconductor and advanced materials industries; industrial analysis and research in the field of production and post-processing of implant materials as well as the creation of specialized biocompatible surfaces; industrial analysis and research in the field of non-destructive characterization of materials in the semiconductor and advanced materials industries; Medical and pharmacological research services; Research and development of metrology and material solutions; Data mining; Software development, except for software development in the field of project-, transaction-, and asset-portfolio-management; Non-destructive testing services; Material testing; Analysis of materials, namely, metallic and ceramic components; non-destructive analysis of materials, namely, metallic and ceramic components; Technical measuring and testing of surfaces of metallic and ceramic components; Development of measuring and testing methods for non-destructive characterization of materials in the semiconductor and advanced materials industries; Inspection of goods, namely, implants wafers, and ingots, for quality control; inspection of material, namely, implants, wafers, and ingots, and of components, namely, metallic and ceramic components, for quality control; inspection of material, namely, implants, wafers, and ingots, and of components, namely, metallic and ceramic components, for quality control, for the purpose of inspection of surfaces and layer thicknesses; technical consulting for the project drawing, planning, and development of the aforementioned systems. | ACTIVE | — |
Related trademarks
CopyMark links this record to cited §2(d) serials, the owner's other marks, Nice classes, similar mark names, and recently changed USPTO applications.
- Other trademarks owned by PVA TePla AG
- Other trademarks in Class 006
- Other trademarks in Class 007
- Other trademarks in Class 009
- Other trademarks in Class 010
- Other trademarks in Class 011
- Other trademarks in Class 014
- Other trademarks in Class 040
- Other trademarks in Class 042
- Similar marks named PVA
- Prosecution event GNRN explained
- Recently changed USPTO trademarks
- Recently filed trademarks
- Browse all trademark records
Prosecution history
| Date | Code | Event | What it means |
|---|---|---|---|
| Sep 30, 2026 | GNRN | NOTIFICATION OF NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Sep 30, 2026 | GNRT | NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Sep 30, 2026 | CNRT | NON-FINAL ACTION WRITTEN | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Sep 15, 2026 | TEME | TEAS/EMAIL CORRESPONDENCE ENTERED | — |
| Sep 15, 2026 | CRFA | CORRESPONDENCE RECEIVED IN LAW OFFICE | — |
| Sep 15, 2026 | TROA | TEAS RESPONSE TO OFFICE ACTION RECEIVED | This event means the applicant filed a response to a USPTO Office Action — typically arguments, amendments, or evidence addressing the examiner's objections. The USPTO will review the response and either allow the mark to proceed or issue another action. |
| Sep 12, 2026 | EWAF | TEAS WITHDRAWAL OF ATTORNEY RECEIVED-FIRM RETAINS | — |
| Sep 12, 2026 | TCCA | TEAS CHANGE OF CORRESPONDENCE RECEIVED | — |
| Sep 12, 2026 | ARAA | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | This event means the applicant filed a response to a USPTO Office Action — typically arguments, amendments, or evidence addressing the examiner's objections. The USPTO will review the response and either allow the mark to proceed or issue another action. |
| Sep 12, 2026 | REAP | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | — |
| Jun 25, 2026 | GNRN | NOTIFICATION OF NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Jun 25, 2026 | GNRT | NON-FINAL ACTION E-MAILED | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Jun 25, 2026 | CNRT | NON-FINAL ACTION WRITTEN | A non-final Office Action means the USPTO examining attorney has raised at least one issue with your trademark application but has not made a final decision. You usually have three months to respond with arguments, amendments, or evidence. Missing the deadline can abandon the application. |
| Jun 22, 2026 | DOCK | ASSIGNED TO EXAMINER | — |
| Jun 21, 2026 | NWOS | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | — |
| Feb 23, 2026 | MAFR | APPLICATION FILING RECEIPT MAILED | — |
| Feb 23, 2026 | NWAP | NEW APPLICATION ENTERED | — |